CREATE: Cross-Layer Resilience Characterization and Optimization for Efficient yet Reliable Embodied AI Systems
Published in ASPLOS 2026, 2026
Characterizing the reliability of LLM-based embodied AI systems across the application, system, and circuit layers, with error detection and correction techniques for efficient yet reliable embodied AI.
Recommended citation: T. Xie*, Y. Qi*, J. Wen, Z. Wan, Y. Dong, Z. Wang, S. Cai, Y. Liang, T. Jia, Y. Wang, R. Wang, and M. Li. "CREATE: Cross-Layer Resilience Characterization and Optimization for Efficient yet Reliable Embodied AI Systems." International Conference on Architectural Support for Programming Languages and Operating Systems (ASPLOS), 2026. (*Equal contribution)
Download Paper